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Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
PASS is a computer program for estimating sample size or determining the power of a statistical test or confidence interval. NCSS LLC is the company that produces PASS. NCSS LLC also produces NCSS (for statistical analysis). PASS includes over 920 documented sample size and power procedures. Major statistical topics in PASS. Means - 1 or 2 Groups
In a scientific study, post hoc analysis (from Latin post hoc, "after this") consists of statistical analyses that were specified after the data were seen. [ 1 ] [ 2 ] They are usually used to uncover specific differences between three or more group means when an analysis of variance (ANOVA) test is significant. [ 3 ]
For less demanding applications, or when the sample is damaged by a vacuum (e.g. a volatile sample), a helium-swept X-ray chamber can be substituted, with some loss of low-Z (Z = atomic number) intensities.
In granulometry, the particle-size distribution (PSD) of a powder, or granular material, or particles dispersed in fluid, is a list of values or a mathematical function that defines the relative amount, typically by mass, of particles present according to size. [1]
In engineering and science, dimensional analysis is the analysis of the relationships between different physical quantities by identifying their base quantities (such as length, mass, time, and electric current) and units of measurement (such as metres and grams) and tracking these dimensions as calculations or comparisons are performed.
XPS physics - the photoelectric effect.. Because the energy of an X-ray with particular wavelength is known (for Al K α X-rays, E photon = 1486.7 eV), and because the emitted electrons' kinetic energies are measured, the electron binding energy of each of the emitted electrons can be determined by using the photoelectric effect equation,
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.